OOF OOF (Object-Oriented Finite element analysis of real material microstructures) is designed to help materials scientists calculate macroscopic properties from images of real or simulated microstructures. It is composed of two cooperating parts: ppm2oof and oof. ppm2oof reads images in the ppm (Portable Pixel Map) format and assigns material properties to features in the image. oof conducts virtual experiments on the data structures created by ppm2oof to determine the macroscopic properties of the microstructure. Currently, the programs calculate stresses and strains, but someday we hope to include thermal, electric, and magnetic field calculations.

Current Version:   1.0.6 License Type:   Public Domain

Home Site: http://www.ctcms.nist.gov/oof/ Source Code Availability: Yes (C++) Available Binary Packages: Debian Package: No RedHat RPM Package: No Other Packages: Yes Targeted Platforms: SGI, Sun (Solaris-2), Alpha (Linux), and PC (Linux) Software/Hardware Requirements: None

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